III · Science
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Subjects
Physical organic chemistry · Materials · Microreactors · Ceramic materials · Semiconductors · Scanning electron microscopes
Language
ENG
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![Cover of [William Wheeler Hubbell, authorized to apply for patents.] by United States. Congress. Senate. Committee on Patents](/img/cover/10200621-M.jpg)
