III · Science
Interferogram analysis for optical testing
Subjects
Diffraction patterns · Interferometers · Optical measurements · Data processing · Interferometry · Energy Technology & Engineering
Language
ENG
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![Cover of [William Wheeler Hubbell, authorized to apply for patents.] by United States. Congress. Senate. Committee on Patents](https://covers.openlibrary.org/b/id/10200621-M.jpg)
