III · Science
Statistical analysis and modelling of spatial point patterns
Subjects
Spatial analysis (Statistics) · Mathematical modelling · Science · Mathematics · Science/Mathematics · Probability & Statistics - General
Language
ENG
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![Cover of [William Wheeler Hubbell, authorized to apply for patents.] by United States. Congress. Senate. Committee on Patents](https://covers.openlibrary.org/b/id/10200621-M.jpg)
