III · Science
Transmission electron microscopy and diffractometry of materials
Subjects
Materials · Microscopy · Transmission electron microscopy · X-ray diffractometer · Applied physics & special topics · Testing Of Materials
Language
ENG
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![Cover of [William Wheeler Hubbell, authorized to apply for patents.] by United States. Congress. Senate. Committee on Patents](https://covers.openlibrary.org/b/id/10200621-M.jpg)
